• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    The invention relates to a method for tracking the quality of a linear textile structure, in particular a yarn, with the aid of an optical sensor which comprises an optical line sensor and a radiation source, wherein the optical line sensor comprises one or two rows of individual optical elements (10) with a rectangular shape and each optical element at an output provides an analog signal corresponding to a degree of irradiation of the optical element. The linear textile structure is irradiated by means of the radiation source with a radiation which cyclically alternately has a low radiation intensity and a high radiation intensity, wherein in each cycle the analog signals of all the individual optical elements (10) are tracked and detected at the high radiation intensity, and by the At the high radiation intensity detected signals for each individual optical element (10) a value of the analogue signal, which is determined at the low radiation intensity either in advance or in the corresponding cycle, is subtracted, whereby a resulting value of the analogue signal is determined is freed from all parasitic influences and whose size depends only on the radiation intensity of the radiation source of the optical sensor. The invention also relates to the optical sensor for carrying out this method.
    公开号:CH709029B1
    申请号:CH01946/14
    申请日:2014-12-15
    公开日:2019-03-15
    发明作者:Kousalik Pavel；Beran Zdenek
    申请人:Rieter Cz Sro；
    IPC主号:
    专利说明:

    description
    TECHNICAL FIELD The invention relates to a method for tracking a quality of a linear textile structure, in particular a yarn, with the aid of an optical sensor which comprises an optical line sensor and a radiation source, the optical line sensor being one or two rows of individual optical elements having a rectangular shape, and each optical element at an output provides an analog signal which corresponds to a degree of irradiation of the optical element.
    The invention further relates to an optical sensor which has a line sensor with a plurality of optical elements, which are arranged in one or two rows next to one another, and a radiation source for determining a quality of a linear textile structure, in particular a yarn, on a textile machine with the help of a vertical projection of the yarn onto individual optical elements of the line sensor by means of the radiation source.
    PRIOR ART Known optical sensors for evaluating the on-line yarn quality have a radiation source and an optical one-line or two-line CMOS sensor, between which the respective yarn moves, the shadow of which projects onto the optical elements of the sensor becomes.
    As a source of light radiation is usually used a source that generates radiation in the visible spectrum or in an infrared spectrum or in an ultraviolet spectrum. The source can be both monochromatic and can be composed of the spectrum of the monochromatic components.
    The influence of parasitic radiation sources can be minimized by a suitable construction of a measuring zone in such a way that the parasitic radiation does not penetrate the respective sensor. However, in order to completely suppress the influence of the parasitic sources, it would be necessary to completely close off the respective measuring zone, which is problematic in the case of a universal sensor that measures the yarn quality. Another way of suppressing the influence of the parasitic sources is to use a source for yarn illumination with a high intensity of the radiation. However, the disadvantage of this method is the high energy consumption of such a source and the high heat loss. It is also possible e.g. to use optical filters that only let through the required radiation spectrum and suppress other things.
    [0006] Each optical element of the CMOS sensor generates an electrical charge that corresponds to the energy of the incident rays. The size of the electrical charge generated depends on the sensitivity of the optical element, the incident light energy and the time of irradiation of the optical element. However, the energy incident on the sensor and therefore also the measurement of the sensor are influenced by parasitic radiation sources (e.g. light bulb, sunlight, flashing rotating lights, etc.), which influence the amount of energy incident on the optical element and thus introduce an error into the measurement , Another parasitic influence is the temperature and the so-called noise of the optical element. The disadvantage of the technology of the optical sensors lies in the fact that the electrons in the optical elements not only as a result of the falling light (from the functional and parasitic radiation sources), but also in the dependence on the ambient temperature, size of the optical sensor, sensor architecture and production technology emerge. Even if the respective sensor is completely in the dark, the optical element generates an output signal that is generated as a result of quantum events in the semiconductor. A positive characteristic is that the parasitic currents are always the same under the respective conditions and are added to the output signal.
    The aim of the invention is to develop a method for tracking a yarn quality or a quality of another linear textile structure with an optical sensor, in which the resulting analog signal is freed from all parasitic influences and its size only from the radiation intensity of the Radiation source of the optical sensor will be dependent. An optical sensor must also be formed to carry out this method.
    Statement of the nature of the invention The object of the invention is achieved by a method for tracking a quality of a linear textile structure, in particular a yarn, with the aid of an optical sensor which comprises an optical line sensor and a radiation source, the optical line sensor being one or comprises two rows of individual optical elements with a rectangular shape and each optical element at an output provides an analog signal which corresponds to a degree of irradiation of the optical element, the linear textile structure using the radiation source with a radiation which alternately has a low radiation intensity and has a high radiation intensity, is irradiated, the analog signals of all individual optical elements being tracked and recorded at the high radiation intensity in each cycle and of the signals recorded at the high radiation intensity for each individual op table element a value of the analog signal, which is determined at the low radiation intensity either in advance or in the corresponding cycle, is subtracted, resulting in a resulting value of the analog signal
    CH 709 029 B1 is determined, which is free from all parasitic influences and the size of which depends only on the radiation intensity of the radiation source of the optical sensor.
    The simplification of the method according to the invention is achieved when the radiation source of the optical sensor emits a zero radiation when irradiated with a low radiation intensity. The radiation source does not or does not radiate in this case, which can be easily regulated and followed without the need to set different radiation intensities of the respective source.
    To compare the analog signals from the successive measurements, it is advantageous if the analog signals of the individual optical elements are tracked during the interval with the high radiation intensity, the intervals during which the analog signals of the individual optical elements of the high radiation intensity are identical.
    At the same time, it is advantageous if the analog signals of the individual optical elements are tracked at a low radiation intensity during an interval, the intervals during which the analog signals of the individual optical elements are tracked at the low radiation intensity are identical.
    To simplify the evaluation, the low and high radiation intensity of the radiation source of the optical sensor alternate cyclically at a frequency which is equal to an undivided multiple of an evaluation frequency of the optical line sensor.
    The radiation intensity of the radiation source changes with the size of a current that is fed into the respective radiation source. In the case of zero radiation intensity, no current is fed into the radiation source.
    With regard to the price, it is advantageous if the radiation source is formed by an LED diode.
    The essence of the optical sensor for performing the inventive method is that it has a line sensor with a plurality of optical elements, which are arranged in one or two rows next to each other, and a radiation source and for determining a quality of a linear textile structure, in particular a yarn, on a textile machine with the aid of a vertical projection of the linear textile structure onto individual optical elements of the line sensor by means of the radiation source, the radiation source for the cyclical irradiation of individual optical elements of the line sensor by means of radiation with a high radiation intensity and radiation with a low radiation intensity, and analog circuits for evaluating analog signals of the individual optical elements are coupled to a source for control signals for controlling the radiation intensity of the radiation source and for controlling the analog circuits d in order to enable the radiation source and the analog circuits to be synchronized in time. For time synchronization, it is advantageous if the lengths of the intervals are identical in the case of a low and high radiation intensity and the times of the scanning are synchronized with the evaluation frequency of the optical line sensor.
    The simplification of the construction and the increase in the reliability of the optical line sensor can be achieved if at least the source for control signals, the analog circuits which evaluate the analog signals from individual optical elements, and individual optical elements of the respective sensor on a common semiconductor substrate are arranged.
    Explanation of the drawings The drawings are used to explain the invention; in which shows:
    1 is a graphical representation of the degree of irradiation of the individual optical element of the respective sensor,
    2 is a drawing of a circuit that works according to the invention,
    3a shows the time course of the radiation from the radiation source, the tracking of the analog values of the optical elements and the data processing from the optical elements with a continuous tracking of the analog signal at a low radiation intensity, and
    3b shows the time course of the radiation from the radiation source, the tracking of the analog values of the optical elements and the data processing from the optical elements with the previously sampled analog value at a low radiation intensity.
    EMBODIMENTS OF THE INVENTION Optical sensors for on-line tracking of the yarn quality or the quality of another linear textile structure on the textile machine which produces or processes the respective yarn or another linear textile material have a radiation source and an optical one or two line sensor , usually a CMOS sensor. The yarn or other linear textile structure moves in the radiation flow between the radiation source and the optical sensor onto which the vertical yarn image projects.
    CH 709 029 B1 Individual optical elements 10 of the sensor provide an analog signal at their output which corresponds to the degree of their irradiation. In Fig. 1, the irradiance of the optical element is shown graphically, the black color representing the analog signal, which corresponds to the amount of energy that falls on the optical element and / or which is caused by parasitic influences such as temperature and noise of the optical element and parasitic Radiation sources is formed.
    The value M is the maximum value that the optical element can grant at its output in saturation, that is, when irradiated by a very strong light source.
    Ft is the parasitic value that the optical element, which is not irradiated by the light source of the sensor, provides at its output, and that at a low, zero radiation intensity. This parasitic value corresponds to the sum of all parasitic influences, i.e. parasitic radiation sources and parasitic influences, which depend on the temperature of the sensor in the vicinity of the optical element, the size of the optical element, the sensor architecture and the production technology.
    As far as the low radiation intensity is not zero, the value Ft is increased by the energy which is caused by this radiation with a low intensity.
    Fs is the value that the optical element, which is irradiated by the light source at a high radiation intensity, provides at its output, and which also contains a parasitic value Ft.
    Fr is the resulting value of the analog signal after subtracting all parasitic influences.
    Fr = Fs - Ft In order that it is possible to process the above-mentioned values in this way, they must be obtained from each optical element for the identically long interval. For this purpose, the radiation source with a cyclically alternating low radiation intensity and high radiation intensity that irradiates the respective yarn is used, the frequency of the cycles of the radiation source being higher or at least equal to the evaluation frequency of the respective sensor. The cyclical alternation of the radiation with a low intensity and radiation with a high intensity is shown in FIGS. 3a, 3b, where the low radiation intensity is zero for the sake of simplification. The time 1 represents the beginning of the radiation with a high intensity and the time 6 the end of the radiation with a high intensity and at the same time the beginning of the radiation with a low intensity, in the example shown with zero intensity. The radiation with a low intensity continues in a further point in time 1 until the radiation with a high intensity is picked up again. Time 2 denotes the beginning of the measurement of the optical element, regardless of whether it is already in the interval of radiation with a high intensity or in the interval of radiation with a low intensity. Time 3 denotes the end of the measurement of the optical element for high radiation intensity and at the same time the time of storage of the analog measurement value for high radiation intensity for the respective optical element, which is equal to the value Fs. The time 4 denotes the end of the measurement of the optical element for low radiation intensity and at the same time the time of storage of the analog measurement value for low radiation intensity, which is equal to the parasitic value Ft at a low zero radiation intensity. The time 5 denotes the data processing from the optical element, that means subtracting the parasitic value Ft from the total value Fs and storing the resulting value for further processing.
    As shown in Fig. 3a, the values Ft and Fs can be subtracted in each cycle. 3b, the parasitic value Ft is determined and stored at the start of the measurement and in the individual cycles only the total value Fs is tracked, which compares with the parasitic value Ft which is determined and stored at the start of the measurement. Both of these methods can of course be combined in a suitable manner; For example, the parasitic value Ft can always be determined when the work of the machine in which the tracking is interrupted, for example when the yarn spinning process is interrupted, both as a result of the break and the replacement of the full bobbin with an empty bobbin.
    As shown in Fig. 2 for an optical element 10 of the sensor, the analog signal from the optical element 10 via the charge amplifier 20 into the memory cell 310 or into the memory cell 320, which together with the charge amplifier 20 with the source 40 of the control signals are coupled, which ensures their synchronization with a radiation source, not shown. This ensures that the analog value Ft, which is generated by the influence of all parasitic influences in such a time when the radiation source is not emitting (low value of the radiation intensity is equal to zero) and the optical element therefore, is stored in the memory cell 320 is not irradiated, and that analog value Fs that is generated by the optical element at such a time when the radiation source is emitting and therefore the optical element is being irradiated is stored in the memory cell 310. The value Fs therefore has both the signal generated by the radiation source of the sensor and the signal generated by the influence of the parasitic influences. The signals Fs and Ft are fed to the output of the differential element 50, at the output of which the signal is
    Fr = Fs - Ft, which is subsequently converted in the analog-digital converter 60 to the signal Fp. To ensure synchronization, both the differential element 50 and the analog-digital converter 60 are coupled to the source 40 of the control signals.
    CH 709 029 B1 In the solution mentioned, the analog values for all optical elements are sampled and stored regardless of whether the respective optical element is unshaded or partially or completely shaded by the yarn.
    In order for the respective results to be correct, it is necessary that the two intervals during which the stored signals are formed are identical, and so that the start of the measurement and the times at which the values are stored in the memory cells are correctly timed and synchronized , Therefore, the source for control signals is also formed on the same semiconductor substrate. The source for control signals generates the signal for controlling the intensity of the radiation source, determines the start of the measurements, determines the time for the integration of the electrical charge and the end of the measurement of the individual analog values, synchronizes the value storage in memory cells and the execution of the calculation.
    In such cases, in which the intervals in which the electrical charge is integrated differ, the values obtained must be converted in the ratio of the lengths of the respective intervals.
    The value Fs for the time T of the radiation from the source is stored in the memory cell 310 and the parasitic value Ft for the time T is stored in the memory cell 320 when the source is switched off, that is to say at a zero radiation intensity. The resulting analog value Fr.
    Reference symbol list [0033]
    M maximum value of the irradiation of the optical element
    Ft parasitic value of the irradiation of the optical element
    Fs total value of the irradiation of the optical element
    For the resulting value of the irradiation of the optical element
    Fp digitized signal
    T time of source radiation
    Beginning of high intensity radiation
    Start of the measurement of the optical element
    End of measurement of the optical element and storage of the value for high intensity
    End of measurement of the optical element and storage of the value for low intensity
    Data processing from the optical element
    End of radiation with a high intensity optical element of the sensor
    charge amplifier
    310 memory cell for Fs
    320 storage cell for Ft
    Control signal source
    Difference element analog-digital converter
    权利要求:
    Claims (10)
    [1]
    claims
    1. A method for tracking a quality of a linear textile structure, in particular a yarn, with the aid of an optical sensor which comprises an optical line sensor and a radiation source, the optical line sensor having one or two rows of individual optical elements (10) with a rectangular shape and each optical element provides an analog signal at an output which corresponds to a degree of irradiation of the optical element, characterized in that the linear textile structure by means of the radiation source with a radiation which cyclically alternates a low radiation intensity and a high radiation intensity
    CH 709 029 B1, is irradiated, the analog signals of all individual optical elements (10) being tracked and recorded at the high radiation intensity in each cycle and of the signals recorded at the high radiation intensity for each individual optical element (10) The value of the analog signal, which is determined at the low radiation intensity either in advance or in the corresponding cycle, is subtracted, whereby a resultant value of the analog signal is determined, which is free from all parasitic influences and the size of which depends only on the radiation intensity of the radiation source of the optical sensor is dependent.
    [2]
    2. The method according to claim 1, characterized in that the radiation source of the optical sensor emits a zero radiation when irradiated with the low radiation intensity.
    [3]
    3. The method according to claim 1 or 2, characterized in that the analog signals of the individual optical elements (10) are tracked during the high radiation intensity in each case during an interval, the intervals during which the analog signals of the individual optical elements (10) are tracked at the high radiation intensity, are identical.
    [4]
    4. The method according to any one of the preceding claims, characterized in that the analog signals of the individual optical elements (10) at a low radiation intensity are each tracked during an interval, the intervals during which the analog signals of the individual optical elements (10) are tracked at the low radiation intensity are identical.
    [5]
    5. The method according to claims 3 and 4, characterized in that the intervals during which the analog signals of the individual optical elements (10) are tracked at a low radiation intensity, and the intervals during which the analog signals of the individual optical elements ( 10) are tracked at a high radiation intensity, have the same length.
    [6]
    6. The method according to claim 1, characterized in that the low and high radiation intensity of the radiation source of the optical sensor alternate cyclically with a frequency which is equal to an undivided multiple of an evaluation frequency of the optical line sensor.
    [7]
    7. The method according to any one of the preceding claims, characterized in that the radiation intensity of the radiation source of the optical sensor is changed with the size of a current supplied to the radiation source.
    [8]
    8. The method according to claim 7, characterized in that the radiation source is formed by an LED diode.
    [9]
    9. Optical sensor for performing the method according to one of the preceding claims, which has a line sensor with a plurality of optical elements (10), which are arranged in one or two rows next to one another, and a radiation source, for determining a quality of a linear textile structure, in particular of a yarn on a textile machine with the aid of a vertical projection of the linear textile structure onto individual optical elements (10) of the line sensor by means of the radiation source, characterized in that the radiation source for the cyclical irradiation of individual optical elements (10) of the line sensor by means of radiation with a high Radiation intensity and radiation with a low radiation intensity, and analog circuits for evaluating analog signals of the individual optical elements (10) with a source (40) for control signals for controlling the radiation intensity of the radiation source and for controlling the analog signal ltungen are coupled to enable a temporal synchronization of the radiation source and the analog circuits.
    [10]
    10. Optical line sensor according to claim 9, characterized in that the source (40) of the control signals, the analog circuits and the individual optical elements (10) of the line sensor are arranged on a common semiconductor substrate.
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    引用文献:
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    法律状态:
    2015-07-31| PK| Correction|Free format text: BERICHTIGUNG ERFINDER |
    优先权:
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    CZ2013-1016A|CZ20131016A3|2013-12-17|2013-12-17|Method of monitoring quality of yarn or another linear configuration in optical scanner of yarn quality and line optical scanner for making the same|
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